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Method of measuring the thickness of radioactive thin filmsThickness monitor consists of proportional X-ray counter coupled to pulse counting system, copper filter over face of counter, rotatable collimator containing radioactive source, and rotatable shutter. Monitor can be used as integral part of neutron generator. It has been used to measure titanium tritide film thicknesses from 0.1 to 30 micrometers.
Document ID
19740000065
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Alger, D. L.
Steinberg, R.
Makinen, M. D.
Date Acquired
August 7, 2013
Publication Date
July 1, 1974
Subject Category
Physical Sciences
Report/Patent Number
LEW-11971
Accession Number
74B10065
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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