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X-ray quantum efficiencies of CCD'sThe X-ray quantum efficiency of a CCD was still high enough to obtain good X-ray imaging with this device. The range and response of the CCD to incident X-rays in the 5 to 14.1 KeV range were determined experimentally. Knowledge of this range and response allows direct measurement of quantum efficiency. Quantum efficiency decreased monotonically from 82% to 35% in the range studied. Comparison of experimental and theoretical quantum efficiencies allowed a determination of silicon bulk electron diffusion length. For the device studied, the electron diffusion length was 75 micrometers.
Document ID
19770010333
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Peckerar, M. (Westinghouse Electric Corp. Baltimore, MD, United States)
Baker, W. D. (Westinghouse Electric Corp. Baltimore, MD, United States)
Nagel, D. J. (Westinghouse Electric Corp. Baltimore, MD, United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1976
Publication Information
Publication: JPL Conf. on Charge-Coupled Device Technol. and Appls.
Subject Category
Optics
Accession Number
77N17276
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19770010320Collected WorksConference on Charge-Coupled Device Technology and Applications
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