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Further tests of the suits reflectance modelExperiments performed by stacking cotton leaves in the port of a spectroradiometer indicate that single leaf reflectance ceases to vary with more than two leaves in the visible region and eight leaves in the infrared region. Chance and LeMaster have shown that the Suits spectral reflectance model predicts an asymptotic dependence of crop reflectance on leaf area index (LAI) with crop reflectance static for leaf area indices in excess of two in the visible regions and six in the infrared regions of the spectrum. These results are experimentally verified in the field for Milam and Penjamo spring wheat, and a theoretical relationship is discussed that relates crop reflectance at 650 nm to crop canopy LAI. Experimental data are given that relate observer zenith angle to crop reflectance for wheat. The Suits reflectance model calculations for wheat fail to agree with this data.
Document ID
19780006576
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lemaster, E. W.
(Pan American Univ. Edinburg, TX, United States)
Chance, J. E.
(Pan American Univ. Edinburg, TX, United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1977
Publication Information
Publication: ERIM Proc. of the 11th Intern. Symp. on Remote Sensing of Environment, Vol. 1
Subject Category
Earth Resources And Remote Sensing
Accession Number
78N14519
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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