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Passive components for high temperature operationThe development of resistors, capacitors, and interconnect metalizations utilizing a low pressure chemical vapor deposition (LPCVD) process is described. The LPCVD process allows the passive components to be fabricated at temperatures higher than their highest operating temperatures. The deposition of thin films by LPCVD is accomplished by reacting one or more gases on the surface of a heated substrate. The substrates to be coated are placed on a graphite susceptor and then loaded into the center of a quartz reaction tube. The RF power is applied to the coil on the outside of the reaction tube which in turn is coupled into the graphite susceptor causing it to heat. Pressures of several torr or less are typical, with carrier flow rates of 0.1 to 2.0 liters/min. Nitrogen, hydrogen, and helium are typical carrier gases. These are controlled with mass flow controllers and the pressure is continuously monitored with a capacitive manometer. Materials selection and device testing are also discussed.
Document ID
19820007441
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Raymond, L. S.
(Arizona Univ. Tucson, AZ, United States)
Clark, D. R.
(Arizona Univ. Tucson, AZ, United States)
Black, D. O.
(Arizona Univ. Tucson, AZ, United States)
Hamilton, D. J.
(Arizona Univ. Tucson, AZ, United States)
Kerwin, W.
(Arizona Univ. Tucson, AZ, United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA. Lewis Research Center Proc. of the Conf. on High-Temp. Electron.
Subject Category
Electronics And Electrical Engineering
Accession Number
82N15314
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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