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Development of an 1100 deg F capacitorThe feasibility of developing a high temperature capacitor for 1100 F operation which is as small and light as conventional capacitors for normal operating temperatures is discussed. Pyrolyic boron nitride (PBN) was selected for the dielectric. The PBN capacitors were made by slicing and lapping material from thick blocks and then sputtering thin film electrodes. These capacitors had breakdown strengths of 7,000 volts per mil and a dissipation factor of less than 0.001 at 1100 F. Additional processing improvements were made after testing a multi-layer or stacked PBN capacitor for 1,000 hours at 1100 F. Sputter etching the wafers before depositing electrodes resulted in a reduction in dissipation factor. A sputtered boron nitride film applied to the outer electrode surfaces produced a more stable capacitor. A design for a 0.1 mu F capacitor and a summary of PBN wafer fabrication costs are given.
Document ID
19820007442
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Stapleton, R. E.
(Panelvision Corp. Pittsburgh, PA, United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA. Lewis Research Center Proc. of the Conf. on High-Temp. Electron.
Subject Category
Electronics And Electrical Engineering
Accession Number
82N15315
Funding Number(s)
CONTRACT_GRANT: NAS3-6465
CONTRACT_GRANT: NAS3-10941
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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