Reflectance Measurements, Part 2

Improving the productivity of spectroreflectometer readings taken to monitor induced contamination of lenses, mirrors, and coatings in the space environment are described. More sophisticated modelling techniques were applied to the laboratory data collected last summer in order to produce a more accurate model of the nonlinearities and noise sources of the instrumentation. This would ultimately allow for correction of known anomalies by the digital computer, yielding an anticipated order to magnitude improvement in the accuracy of the reflectance measurements, while reducing the total measuring time. The construction of and programming for a modernized version of the electronics used in Beckman DK-2 spectroreflectometers suffered because of a schedule lag in fabrication of a modified form of the carrier frequency pickoff. Separate development of the electronics and the computer programming was partially accomplished.