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Further research on high open circuit voltage in silicon solar cellsThe results of a new research on the use of controlled dopant profiles and oxide passivation to achieve high open circuit voltage V sub oc in silicon solar cells is presented. Ion implantation has been used to obtain nearly optimal values of surface dopant concentration. The concentrations are selected so as to minimize heavy doping effects and thereby provide both high blue response and high V sub oc ion implantation technique has been successfully applied to fabrication of both n-type and p-type emitters. V sub oc of up to 660 mV is reported and AMO efficiency of 16.1% has been obtained.
Document ID
19860008372
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Spitzer, M. B.
(Spire Corp. Bedford, MA, United States)
Keavney, C. J.
(Spire Corp. Bedford, MA, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1985
Publication Information
Publication: NASA. Lewis Research Center Space Photovoltaic Research and Technology 1985
Subject Category
Energy Production And Conversion
Accession Number
86N17842
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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