Voltage-temperature charge verification testing of 34 ampere-hour nickel-cadmium cells

This testing was designed to evaluate various voltage-temperature (V-T) charge curves for use in low-Earth-orbit (LEO) applications of nickel-cadmium battery cells. The trends established relating V-T level to utilizable capacity were unexpected. The trends toward lower capacity at higher V-T levels was predominant in this testing. This effect was a function of the V-T level, the temperature, and the cell history. This effect was attributed to changes occurring in the positive plate. The results imply that for some applications, the use of even lower V-T levels may be warranted. The need to limit overcharge, especially in the early phases of missions, is underlined by this test program.