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Surface electrons in inverted layers of p-HgCdTeAnodic oxide passivation of p-type HgCdTe generates an inversion layer. Extremely high Hall mobility data for electrons in this layer indicated the presence of a two-dimensional electron gas. This is verified by use of the Shubnikov-de Haas effect from 1.45 to 4.15 K. Data are extracted utilizing a numerical second derivative of dc measurement. Three sub-bands are detected. Their relative occupancies are in excellent agreement with theory and with experimental results obtained on anodic oxide as accumulation layers of n-type HgCdTe. The effective mass derived is comparable to what was expected.
Document ID
19910008988
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Schacham, Samuel E.
(NASA Lewis Research Center Cleveland, OH., United States)
Finkman, Eliezer
(Technion - Israel Inst. of Tech. Haifa., United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1990
Publication Information
Publication: Solid State Technology Branch of NASA Lewis Research Center Second Annual Digest, June 1989 - June 1990
Subject Category
Solid-State Physics
Accession Number
91N18301
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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