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Silicon carbide semiconductor technology for high temperature and radiation environmentsViewgraphs on silicon carbide semiconductor technology and its potential for enabling electronic devices to function in high temperature and high radiation environments are presented. Topics covered include silicon carbide; sublimation growth of 6H-SiC boules; SiC chemical vapor deposition reaction system; 6H silicon carbide p-n junction diode; silicon carbide MOSFET; and silicon carbide JFET radiation response.
Document ID
19930017739
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Matus, Lawrence G.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: Nuclear Propulsion Technical Interchange Meeting, Volume 1
Subject Category
Solid-State Physics
Accession Number
93N26928
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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