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Optical constants from mirror reflectivities measured at synchrotronsImproved mirror reflectivity measurement techniques have been introduced to permit more accurate determinations of optical constants delta and beta in the complex index of refraction n = 1 - delta - i(beta) over the energy range 50 to 5000 eV. When the density has been determined by X-ray or other means, one can calculate the real and imaginary parts, f-prime and f-double prime, of the complex atomic scattering factor f = f(o) + f-prime + if-double prime from delta and beta. Preliminary results are given for the Ni LIII edge around 852 eV, and the Au M edge region from 2150 to 3500 eV. Since these are the first experimental evaluations of delta for these element edges, they are compared with appropriate reservations to semiempirical tabulations. There is much potential for this technique applied to synchrotron sources.
Document ID
19930055622
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Blake, R. L.
(NASA Headquarters Washington, DC United States)
Davis, J. C.
(Los Alamos National Lab. NM, United States)
Burbine, T. H.
(NASA Headquarters Washington, DC United States)
Graessle, D. E.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Gullikson, E. M.
(Lawrence Berkeley Lab. Berkeley, CA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Optics
Accession Number
93A39619
Distribution Limits
Public
Copyright
Other

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