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Interpolative modeling of GaAs FET S-parameter data bases for use in Monte Carlo simulationsA statistical interpolation technique is presented for modeling GaAs FET S-parameter measurements for use in the statistical analysis and design of circuits. This is accomplished by interpolating among the measurements in a GaAs FET S-parameter data base in a statistically valid manner.
Document ID
19940017250
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Campbell, L. (Idaho Univ. Moscow, ID, United States)
Purviance, J. (Idaho Univ. Moscow, ID, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1992
Publication Information
Publication: The 1992 4th NASA SERC Symposium on VLSI Design
Subject Category
Statistics And Probability
Accession Number
94N21723
Funding Number(s)
CONTRACT_GRANT: NAGW-1406
CONTRACT_GRANT: NSF MIP-91-09618
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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