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Study of Interesting Solidification Phenomena on the Ground and in Space (MEPHISTO)Real-time Seebeck voltage variations in a Sn-Bi melt during directional solidification in the MEPHISTO spaceflight experiment flown on the USMP-3 mission, have been correlated with well-characterized thruster firings and an Orbiter Main System (OMS) burn. The Seebeck voltage measurement is related to the response of the instantaneous average melt composition at the melt-crystal interface. This allowed us to make a direct comparison of numerical simulations with the experimentally obtained Seebeck signals. Based on the results of preflight and real-time computations, several well-defined thruster firing events were programmed to occur at specific times during the experiment. In particular, we simulated the effects of the thruster firings on melt and crystal composition in a directionally solidifying Sn-Bi alloy. The relative accelerations produced by the firings were simulated by impulsive accelerations of the same magnitude, duration and orientation as the requested firings. A comparison of the simulation results with the Seebeck signal indicates that there is a good agreement between the two. This unique opportunity allows us to make the first quantitative characterization of actual g-jitter effects on an actual crystal growth experiment and to calibrate our models of g-jitter effects on crystal growth.
Document ID
19990040243
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Alexander, J. Iwan D.
(National Center for Microgravity Research on Fluids and Combustion Cleveland, OH United States)
Favier, J.-J.
(Commissariat a l'Energie Atomique Grenoble, France)
Garandet, J.-P.
(Commissariat a l'Energie Atomique Grenoble, France)
Date Acquired
August 19, 2013
Publication Date
February 1, 1999
Publication Information
Publication: NASA Microgravity Materials Science Conference
Subject Category
Materials Processing
Funding Number(s)
CONTRACT_GRANT: NAG3-1740
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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