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Pupil Alignment Measuring Technique and Alignment Reference for Instruments or Optical SystemsA technique was created to measure the pupil alignment of instruments in situ by measuring calibrated pupil alignment references (PARs) in instruments. The PAR can also be measured using an alignment telescope or an imaging system. PAR allows the verification of the science instrument (SI) pupil alignment at the integrated science instrument module (ISIM) level of assembly at ambient and cryogenic operating temperature. This will allow verification of the ISIM+SI alignment, and provide feedback to realign the SI if necessary.
Document ID
20100033608
Acquisition Source
Goddard Space Flight Center
Document Type
Other - NASA Tech Brief
Authors
Hagopian, John G.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 25, 2013
Publication Date
September 1, 2010
Publication Information
Publication: NASA Tech Briefs, September 2010
Subject Category
Instrumentation And Photography
Report/Patent Number
GSC-15783-1
Distribution Limits
Public
Copyright
Public Use Permitted.
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