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Wire Test Grip FixtureWire-testing issues, such as the gripping strains imposed on the wire, play a critical role in obtaining clean data. In a standard test frame fitted with flat wedge grips, the gripping action alone creates stresses on the wire specimen that cause the wire to fail at the grip location. A new test frame, which is outfitted with a vacuum chamber, negated the use of any conventional commercially available wire test fixtures, as only 7 in. (17.8 cm) existed between the grip faces. An innovative grip fixture was designed to test thin gauge wire for a variety of applications in an existing Instron test frame outfitted with a vacuum chamber.
Document ID
20110003021
Acquisition Source
Glenn Research Center
Document Type
Other - NASA Tech Brief
Authors
Burke, Christopher S.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
August 25, 2013
Publication Date
January 1, 2011
Publication Information
Publication: NASA Tech Briefs, January 2011
Subject Category
Quality Assurance And Reliability
Report/Patent Number
LEW-18579-1
Distribution Limits
Public
Copyright
Public Use Permitted.
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