NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Software for Probabilistic Risk ReductionA computer program implements a methodology, denoted probabilistic risk reduction, that is intended to aid in planning the development of complex software and/or hardware systems. This methodology integrates two complementary prior methodologies: (1) that of probabilistic risk assessment and (2) a risk-based planning methodology, implemented in a prior computer program known as Defect Detection and Prevention (DDP), in which multiple requirements and the beneficial effects of risk-mitigation actions are taken into account. The present methodology and the software are able to accommodate both process knowledge (notably of the efficacy of development practices) and product knowledge (notably of the logical structure of a system, the development of which one seeks to plan). Estimates of the costs and benefits of a planned development can be derived. Functional and non-functional aspects of software can be taken into account, and trades made among them. It becomes possible to optimize the planning process in the sense that it becomes possible to select the best suite of process steps and design choices to maximize the expectation of success while remaining within budget.
Document ID
20110016806
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other - NASA Tech Brief
Authors
Hensley, Scott
(California Inst. of Tech. Pasadena, CA, United States)
Michel, Thierry
(California Inst. of Tech. Pasadena, CA, United States)
Madsen, Soren
(California Inst. of Tech. Pasadena, CA, United States)
Chapin, Elaine
(California Inst. of Tech. Pasadena, CA, United States)
Rodriguez, Ernesto
(California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
July 1, 2004
Publication Information
Publication: NASA Tech Briefs, July 2004
Subject Category
Man/System Technology And Life Support
Report/Patent Number
NPO-40032
Distribution Limits
Public
Copyright
Public Use Permitted.
No Preview Available