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Examination of Surveyor 3 parts with the scanning electron microscope and electron microprobeTwo screws and two washers, several small chips of tubing, and a fiber removed from a third screw were examined with the scanning electron microscope and the electron microprobe. The purpose of the examination was to determine the nature of the material on the surface of these samples and to search for the presence of meteoritic material.
Document ID
19720019091
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Chodos, A. A.
(California Inst. of Tech. Pasadena, United States)
Devaney, J. R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Evens, K. C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 6, 2013
Publication Date
January 1, 1972
Publication Information
Publication: NASA, Washington Analysis of Surveyor 3 Mater. and Phot. Returned by Apollo 12
Subject Category
Space Sciences
Accession Number
72N26741
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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