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Errors in retarding potential analyzers caused by nonuniformity of the grid-plane potential.One aspect of the degradation in performance of retarding potential analyzers caused by potential depressions in the retarding grid is quantitatively estimated from laboratory measurements and theoretical calculations. A simple expression is obtained that permits the use of laboratory measurements of grid properties to make first-order corrections to flight data. Systematic positive errors in ion temperature of approximately 16% for the Ogo 4 instrument and 3% for the Ogo 6 instrument are deduced. The effects of the transverse electric fields arising from the grid potential depressions are not treated.
Document ID
19720042745
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Hanson, W. B.
Frame, D. R.
Midgley, J. E.
(Texas, University Dallas, Tex., United States)
Date Acquired
August 6, 2013
Publication Date
April 1, 1972
Publication Information
Publication: Journal of Geophysical Research
Volume: 77
Subject Category
Instrumentation And Photography
Report/Patent Number
NSSDC-ID-69-051A-03-PS
NSSDC-ID-67-073A-19-OS
Accession Number
72A26411
Funding Number(s)
CONTRACT_GRANT: NSR-44-004-029
CONTRACT_GRANT: NAS5-9311
Distribution Limits
Public
Copyright
Other

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