Thin-film light-intensity measurement strain-analysis technique.

The optical response to loading of a thin metallic film deposited on a low-modulus structural substrate is studied theoretically and experimentally. Two types of optical properties called total and central-image transmittance (or reflectance) are shown to be related to the mechanical state of the substrate. Empirical optical-mechanical relationships are proposed between these optical properties and the substrate strain field of a general plane-stress problem. A technique based on wrinkle and microfracture patterns is described for determining principal directions of strain. Experimental results for uniaxially loaded specimens show that it is possible to obtain a nearly linear relationship between transmittance and strain for certain materials combinations.