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Erase-mode recording characteristics of photochromic CaF2, SrTiO3, and CaTiO3 crystals.Erase-mode optical recording characteristics of photochromic crystal wafers of CaF2:La,Na; CaF2:Ce,Na; SrTiO3:Ni,Mo,Al; and CaTiO3:Ni,Mo have been measured. An argon laser operating at 5145 A was used for both optical recording and optical readout. Sensitometric curves of optical-density change versus logarithm of exposure are shown for a number of erase-beam intensities between 0.2 mW/sq cm and 2 W/sq cm. In this range, time-intensity reciprocity holds for the CaF2 materials but fails for the titanates, particularly at low intensities. The dependences of sensitivity, gamma, and maximum transmission contrast ratio on wafer thickness and material are discussed. Wafers of SrTiO3, CaTiO3, and CaF2 exhibiting approximately equal maximum contrast ratios have relative sensitivities approximately in the ratio 5:2:1, respectively, at an erase intensity of 1 W/sq cm.
Document ID
19720048695
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Duncan, R. C., Jr.
(RCA Laboratories Princeton, N.J., United States)
Date Acquired
August 6, 2013
Publication Date
March 1, 1972
Publication Information
Publication: RCA Review
Volume: 33
Subject Category
Instrumentation And Photography
Accession Number
72A32361
Funding Number(s)
CONTRACT_GRANT: NAS5-10335
Distribution Limits
Public
Copyright
Other

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