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Temperature profile determination in an absorbing plasma.A new method has been developed to determine the temperature profile of an optically-non-thin plasma. The technique is essentially an extension of the brightness-emissivity method to the case of a cylindrically-symmetric plasma.
Document ID
19720050434
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1016/0022-4073(72)90019-2
Authors
Usher, J. L.
Campbell, H. D. (Florida, University Gainesville, Fla., United States)
Date Acquired
August 6, 2013
Publication Date
July 1, 1972
Publication Information
Publication: Journal of Quantitative Spectroscopy and Radiative Transfer
Volume: 12
Subject Category
Physics, Plasma
Accession Number
72A34100
Funding Number(s)
CONTRACT_GRANT: NGL-10-005-089
Distribution Limits
Public
Copyright
Other

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