Induced shock pulse testing by transient waveform controlA method of synthesizing an arbitrarily shaped transient time pulse on vibration exciters is described. The transient waveform control technique is based on recent developments in digital time series analysis, the real-time FFT processor. A brief description of the theory, error estimates and hardware/software implementation to the JPL Dynamic Environmental Testing Laboratory is presented.
Document ID
19730023128
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Kim, B. K. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)