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Elastohydrodynamic film thickness model for heavily loaded contactsAn empirical elastohydrodynamic (EHD) film thickness formula for predicting the minimum film thickness occurring within heavily loaded contacts (maximum Hertz stresses above 1.04 GN/sq m (150,000 psi)) was developed. The formula was based upon X-ray film thickness measurements made with synthetic paraffinic, fluorocarbon, Type II ester, and polyphenyl ether fluids covering a wide range of test conditions. Comparisons were made between predictions from an isothermal EHD theory and the test data. The deduced relationship was found to adequately reflect the high-load dependence exhibited by the measured data. The effects of contact geometry, material, and lubricant properties on the form of the empirical model are also discussed.
Document ID
19740029600
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Loewenthal, S. H.
Parker, R. J.
Zaretsky, E. V.
(NASA Lewis Research Center; U.S. Army, Air Mobility R & D Laboratory, Cleveland Ohio, United States)
Date Acquired
August 7, 2013
Publication Date
October 1, 1973
Subject Category
Machine Elements And Processes
Report/Patent Number
ASME PAPER 73-LUB-36
Meeting Information
Meeting: Joint Lubrication Conference
Location: Atlanta, GA
Country: US
Start Date: October 15, 1973
End Date: October 18, 1973
Sponsors: American Society of Mechanical Engineers, American Society of Lubrication Engineers
Accession Number
74A12350
Distribution Limits
Public
Copyright
Other

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