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Yield analysis of large capacity magnetic bubble circuits with redundancy designThe fabrication yield of an on-chip modifiable redundant circuit design for a 100M bit serial shift register is evaluated. The yield model is a redundancy design in which there is a primary loop and a set of secondary loops which can be enabled/disabled without introducing blanks to the data stream. This function has a finite yield, the loop-modification yield factor, which must be greater than 0.9 to make the system more economical than the simple nonredundant design. It is further established that small loop capacities greatly degrade the yield because of the effect of the modification yield factor, while large loop capacities degrade the yield because of defects in the operating area. As the modification yield increases the optimum loop capacity decreases. An optimum value for the number of redundant loops exists for each loop capacity. Other factors that affect the yield are the garnet film and the processed circuit.
Document ID
19740062399
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Bailey, R. F.
Reekstin, J. P.
(Rockwell International Corp. Anaheim, Calif., United States)
Date Acquired
August 7, 2013
Publication Date
September 1, 1974
Subject Category
Electronic Equipment
Accession Number
74A45149
Funding Number(s)
CONTRACT_GRANT: NAS1-12981
Distribution Limits
Public
Copyright
Other

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