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A mass spectrometric system for analyzing thermal desorption spectra of ion-implanted argon and cesium in tungstenA mass spectrometric system for determining the characteristics of materials used in instrumental development and aerospace applications was developed. The desorption spectra of cesium that was ion-implanted into polycrystalline tungsten and the effects on the spectra of bombardment of the tungsten by low energy (70 eV) electrons were investigated. Work function changes were measured by the retarding potential diode method. Flash desorption characteristics were observed and gas-reaction mechanisms of the surface of heated metal filaments were studied. Desorption spectra were measured by linearly increasing the sample temperature at a selected rate, the temperature cycling being generated from a ramp-driven dc power supply, with the mass spectrometer tuned to a mass number of interest. Results of the study indicate an anomolous desorption mechanism following an electron bombardment of the sample surface. The enhanced spectra are a function of the post-bombardment time and energy and are suggestive of an increased concentration of cesium atoms, up to 10 or more angstroms below the surface.
Document ID
19750005012
Acquisition Source
Legacy CDMS
Document Type
Thesis/Dissertation
Authors
Wood, G. M., Jr.
(Rensselaer Polytechnic Inst. Troy, NY, United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1974
Subject Category
Metallic Materials
Accession Number
75N13084
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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