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Wheat - Its growth and disease severity as deduced from ERTS-1The spectral reflectance of a cropped surface changes as the plant develops. An indicator of crop growth is leaf area index (ratio of green leaf area to soil area). The leaf area index, disease severity, and yield were determined for several winter wheat fields in Kansas during the 1973 growing season. Multispectral scanner (MSS) data from Earth Resources Technology Satellite-1 (ERTS-1) showed a high correlation (r greater than or equal to 0.90) between crop growth and MSS4/MSS5, and crop growth and MSS5/MSS6. Wheat disease severity and yields were significantly correlated at the 5% level with MSS4/MSS6 and with MSS4/MSS7. Further investigation is required before ERTS imagery can be routinely used detecting and estimating disease severity and yield reduction.
Document ID
19750038653
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kanemasu, E. T.
Niblett, C. L.
Manges, H.
Lenhert, D.
Newman, M. A.
(Kansas State University of Agriculture and Applied Science, Manhattan, Kan., United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1974
Publication Information
Publication: Remote Sensing of Environment
Volume: 3
Issue: 4, 19
Subject Category
Earth Resources And Remote Sensing
Accession Number
75A22725
Distribution Limits
Public
Copyright
Other

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