Measurement of sputtered efflux from 5-, 8-, and 30-cm diameter mercury ion thrusters

A technique has been developed which uses spectral transmittance of samples exposed to thruster efflux to determine and characterize the effect of the efflux on spacecraft surfaces and optical devices. An investigation of facility backsputter revealed that efflux samples must be protected (e.g., by small shield boxes) from materials from tank walls and targets. The composition of the sputter efflux deposited on the samples was mostly molybdenum with trace amounts of tantalum, iron and/or mercury. The efflux from a 5-cm diameter thruster was deposited on samples located in the plane of the accelerator grid; the 8-cm diameter thruster efflux results showed that the location of ion beam sputtering and efflux deposition equilibrium occurred at 57 deg with respect to the thruster axis; and the 30-cm diameter thruster had an ion beam erosion-efflux deposition equilibrium at 45 deg.