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Unfolding first and second order diffracted radiation when using synchrotron radiation sources - A techniqueA technique is presented of using a single calibrated XUV detector for radiometric measurements of synchrotron radiation after the radiation passes through a monochromator that produces a mixture of first- and second-order diffracted radiation. Irradiance measurements are made with the synchrotron source operating at two different energies for the orbiting electrons. The known change in the spectral distribution produced by the electron energy change is used to calculate the flux in both first and second order. The dependence of the precision of these determinations on the two detected currents and on the detector calibration at both first- and second-order wavelengths is calculated. Experimental results using the National Bureau of Standards synchrotron (SURF-I) are presented, and anticipated results for the new NBS electron storage ring (SURF-II) are calculated.
Document ID
19750049521
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Saloman, E. B.
(National Bureau of Standards Washington, D.C., United States)
Date Acquired
August 8, 2013
Publication Date
June 1, 1975
Publication Information
Publication: Applied Optics
Volume: 14
Subject Category
Optics
Accession Number
75A33593
Distribution Limits
Public
Copyright
Other

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