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Laser extensometerDrift-compensated and intensity-averaged laser-based system uses optical and photoelectric effects for precise measurement of small thermally-induced size changes. Final output signal is directly proportional to size of sample shadow and independent of laser intensity, detector dark current, and lateral motion of sample.
Document ID
19760000030
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Stocker, P. L.
(Rockwell Intern. Corp.)
Marcus, H. L.
(Rockwell Intern. Corp.)
Date Acquired
August 8, 2013
Publication Date
March 1, 1976
Publication Information
Publication: NASA Tech Briefs
Volume: 1
Issue: 1
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-19259
Accession Number
76B10030
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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