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High-resolution electron microscopeEmploying scanning transmission electron microscope as interferometer, relative phases of diffraction maximums can be determined by analysis of dark field images. Synthetic aperture technique and Fourier-transform computer processing of amplitude and phase information provide high resolution images at approximately one angstrom.
Document ID
19760000499
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nathan, R.
Date Acquired
August 8, 2013
Publication Date
March 1, 1977
Publication Information
Publication: NASA Tech Briefs
Volume: 1
Issue: 4
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-13811
Accession Number
76B10499
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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