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Detecting contamination on a metal surfaceThin layers of contaminant on metal surface are detected by measuring surface-potential difference between reference electrode and surface of interest. Procedure does not require mechanical contact with surface under examination.
Document ID
19760000552
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Harris, J. M. (Rockwell Intern. Corp.)
Marcus, H. L. (Rockwell Intern. Corp.)
Smith, T. (Rockwell Intern. Corp.)
Date Acquired
August 8, 2013
Publication Date
March 1, 1977
Publication Information
Publication: NASA Tech Briefs
Volume: 1
Issue: 4
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-19260
Accession Number
76B10552
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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