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Traps in Al2O3 detected by tunnelingA structure, quite different from inelastic tunneling peaks, has been observed in electron-tunneling spectra of MOM junctions. A capacitance peak is associated with this structure, which is attributed to traps in the oxide at energies smaller than those previously reported. The C-V characteristics calculated using a single-energy trap model agree with experimental results; however, no satisfactory explanation has yet been found to account for the strong temperature dependence of the trap energy levels.
Document ID
19760064622
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Skarlatos, Y.
(Ecole Polytechnique Montreal Quebec, Canada)
Barker, R. C.
(Yale University New Haven, Conn., United States)
Yelon, A.
(Ecole Polytechnique Montreal, Canada)
Date Acquired
August 8, 2013
Publication Date
October 1, 1976
Publication Information
Publication: Journal of Applied Physics
Volume: 47
Subject Category
Solid-State Physics
Accession Number
76A47588
Distribution Limits
Public
Copyright
Other

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