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Migrated-gold resistive shorts in microcircuitsFailures, failure modes and failure mechanisms related to the formation of migrated-gold resistive shorts (MGRS) in gold-metallized microcircuits will be described. Also, three different methods of screening devices for MGRS will be presented and the impact MGRS can have on device reliability will be discussed.
Document ID
19770034211
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Shumka, A. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Piety, R. R. (California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1975
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Annual Symposium on Reliability physics 1975
Location: Las Vegas, NV
Start Date: April 1, 1975
End Date: April 3, 1975
Accession Number
77A17063
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Other

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