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Modeling of short channel MOS transistorsHigher frequency response in MOS technology can be obtained by shortening the channel length. One approach for doing this involves an employment of higher resolution lithography technology. A second approach makes use of a double-diffused MOS transistor (DMOS). It is pointed out that the ordinary method of modeling the transistors used in both approaches is not accurate. An investigation is conducted of the questions which have to be considered for DMOS modeling. The modeling of a short channel MOS transistor is discussed, taking into account the derivation of the threshold voltage equation. Excellent agreement between theoretical and experimental data shows the accuracy of the described modeling approach.
Document ID
19770055354
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Lin, H. C.
(Maryland, University College Park, Md., United States)
Kokalis, D. P.
(Maryland Univ. College Park, MD, United States)
Bandy, W. R.
(U.S. Department of Defense Fort Meade, Md., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1976
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Annual Pittsburgh Conference on Modeling and simulation
Location: Pittsburgh, PA
Start Date: April 26, 1976
End Date: April 27, 1976
Accession Number
77A38206
Funding Number(s)
CONTRACT_GRANT: NAS1-11369
Distribution Limits
Public
Copyright
Other

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