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Shock during PIND test frees particlesRecent study on Particle-Impact Noise-Detection (PIND) shows impact at 1,500 to 4,000 G normally imparted to hybrid microcircuits during testing knocks loose stray trapped particle that can be subsequentially removed. Process may be 80 to 90 percent effective in removal of particles depending on type of test utilized.
Document ID
19780000389
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Caruso, S. V. (Hughes Aircraft Co.)
Keister, F. Z.
Date Acquired
August 9, 2013
Publication Date
January 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-23829
Accession Number
78B10389
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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