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Instrument measures many optical properties in visible and IRElectro-optical system measures reflectance, reflectance ratio, transmission, absorption, refractive index, and absorption coefficient in both visible and infrared (IR) spectral regions. System effectively combining capabilities of ellisometer, reflectometer, and spectrophotometer is expected to find application in environmental and material composition testing fields.
Document ID
19780000489
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Batten, C. E.
Date Acquired
August 9, 2013
Publication Date
March 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 4
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-12285
Accession Number
78B10489
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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