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Measurement of subcoat thickness by characteristic x-raysTechnique employs x-ray scanning system to measure thickness of topcoat and subcoat of heat shields and other ceramic materials. System scans sample in raster pattern and depicts image of structure on cathode-ray-tube for viewing or photocopying within seconds.
Document ID
19780000505
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Harris, W. J. (Lockheed Missiles and Space Co.)
Quinn, R. A. (Lockheed Missles and Space Co.)
Date Acquired
August 9, 2013
Publication Date
March 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 4
ISSN: 0145-319X
Subject Category
Materials
Report/Patent Number
MSC-16718
Accession Number
78B10505
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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