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Sensitivities of particle impact noise detectionThe results of a study on Particle Impact Noise Detection commonly referred to as PIND testing is described. Certain sensitivities of PIND testing as applicable to hybrid microcircuits were determined, and techniques for removing particles from sealed hybrid packages were evaluated. Methods for freeing particles which have become trapped or hung up inside the hybrid package and, therefore, give no PIND test response were examined.
Document ID
19780008334
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Keister, F. Z. (Hughes Aircraft Co. Culver City, Calif., United States)
Caruso, S. V. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 9, 2013
Publication Date
November 1, 1977
Publication Information
Publication: Proc. of the 1977 NASA(ISHM Microelectronics Conf.
Subject Category
Electronics And Electrical Engineering
Accession Number
78N16277
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19780008323Collected WorksProceedings of the 1977 NASA/ISHM Microelectronics Conference
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