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An XPS /ESCA/ study of lunar surface alteration profilesWe describe several important potential applications of surface analyses in planetology, and discuss some fundamental questions pertinent to the use of X-ray photoemission spectroscopy XPS or Auger electron spectroscopy AES to study complex powder samples. It appears that in addition to specific studies of surface chemistry, XPS may be able to provide useful major element analyses for all elements except hydrogen and perhaps helium and lithium. We provide data on the chemical changes associated with sputtering of a synthetic lunar glass. The surface is depleted in Si and enriched in Ca and Ti with Fe remaining nearly constant in parallel with changes observed during thermal volatilization. No Fe reduction was observed. Composition profiles obtained by sputtering 15301 fines suggest that surface alterations and reduced Fe are confined largely to depths of a few 100 A.
Document ID
19780057864
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Housley, R. M.
(Rockwell International Science Center Thousand Oaks, CA, United States)
Grant, R. W.
(Rockwell International Science Center Thousand Oaks, Calif., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1977
Subject Category
Lunar And Planetary Exploration
Meeting Information
Meeting: Lunar Science Conference
Location: Houston, TX
Start Date: March 14, 1977
End Date: March 18, 1977
Accession Number
78A41773
Funding Number(s)
CONTRACT_GRANT: NAS9-11539
Distribution Limits
Public
Copyright
Other

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