NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Test and evaluation of bubble memoriesA description is presented of a test program which has shown that well-constructed bubble memories can operate reliably over long periods of time and at low error rates. Even the relatively high error rate of one memory during burn-in can be considered acceptable if compared with tape recorder standards. No wear-out mechanism or aging could be detected. Bubble memories are now considered suitable for long-duration space missions and certainly are suitable for many military and commercial applications. It must be recognized, however, that bubble memories are complex devices and not yet fully understood. While the particular memory tested may never find practical applications, it nevertheless has provided insight into performance characteristics considered typical of bubble memories.
Document ID
19780067342
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Bahm, E.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)
Date Acquired
August 9, 2013
Publication Date
September 1, 1978
Subject Category
Computer Operations And Hardware
Accession Number
78A51251
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available