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Troubleshooting plated-wire memoriesFaults in plated wire memories are identified and located from outside of system by applying electrical impulses and analyzing their reflectance in technique of Time-Domain Reflectometry (TDR). Intermittent faults are easier to find because memory system is not disturbed by probing or disassembly.
Document ID
19790000099
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Baker, C. M. (Honeywell Inc.)
Bright, T. M. (Honeywell Inc.)
Constable, R. C. (Honeywell Inc.)
Date Acquired
August 10, 2013
Publication Date
August 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 1
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-23903
Accession Number
79B10099
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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