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Vise holds specimens for microscopeConvenient, miniature, spring-loaded clamp holds specimens for scanning electron microscope. Clamp is made out of nesting sections of studded angle-aluminum. Specimens are easier to mount and dismount with vise than with conductive adhesive or paint.
Document ID
19800000098
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Greule, W. N. (Rockwell, International Corp.)
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Machinery
Report/Patent Number
MSC-18690
Accession Number
80B10098
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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