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Dual-Laser Schlieren SystemProposed schlieren system uses two lasers and two knife edges to simultaneously view perpendicular refractive-index gradients in a test volume. It is improvement over conventional schlieren systems, which monitor gradient along only one axis. Although originally developed to monitor materials-processing experiments in space, it should find application wherever there is need to study two-dimensional temperature, pressure, concentration or other gradients related to index of refraction.
Document ID
19810000052
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Owen, R. B.
Wintherow, W. K.
Date Acquired
August 11, 2013
Publication Date
September 1, 1982
Publication Information
Publication: NASA Tech Briefs
Volume: 6
Issue: 1
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-25315
Accession Number
81B10052
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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