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Surface-Contamination Inspection Tool for Field UseInspection tool detects surface contamination by measuring photoelectron emission. No vacuum chamber or controlled environment is used. Photoemission is measured under ordinary atmospheric conditions, so surfaces may easily be inspected in factories or in the field.
Document ID
19810000190
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Smith, T. (Rockwell International Corp.)
Date Acquired
August 11, 2013
Publication Date
November 1, 1982
Publication Information
Publication: NASA Tech Briefs
Volume: 6
Issue: 2
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-25581
Accession Number
81B10190
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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