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Mass-Loss Buttons Monitor Material DegradationSmall button-sized samples attached to parent materials are simple way of monitoring degradation of parent in harsh environments. Samples determine effects of multiple exposures to environmental extremes without disturbing fit or function of parent. They are less costly and more convenient than complex instrumentation normally required to measure complete temperature/pressure time history of parent component.
Document ID
19810000307
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Webster, C. N.
(Vought Corp.)
Date Acquired
August 11, 2013
Publication Date
December 1, 1982
Publication Information
Publication: NASA Tech Briefs
Volume: 6
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MSC-18903
Accession Number
81B10307
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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