NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Ultrasonic scanning of multilayer ceramic chip capacitorsUltrasonic scanning is compared to neutron radiography and scanning laser acoustic microscopy (SLAM). Data show that SLAM and ultrasonic scanning evaluations are in good agreement. There is poor agreement between N-ray and both ultrasonic techniques because N-ray is insensitive to all but the grossest delaminations. Statistical analysis show a good correlation between ultrasonic scanning and destructive physical analysis.
Document ID
19810017851
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bradley, F. N. (AVX-Ceramics Corp. Myrtle Beach, SC, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Technol., Appl. and Reliability
Subject Category
Electronics And Electrical Engineering
Accession Number
81N26388
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.

Related Records

IDRelationTitle19810017835Collected WorksCapacitor Technologies, Applications and Reliability
No Preview Available