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Adherence of ion beam sputter deposited metal films on H-13 steelAn electron bombardment argon ion source sputter deposited 17 metals and metal oxides on H-13 steel. The films ranged 1 to 8 micrometers in thickness and their adherence was generally greater than the capacity of the measuring device; adherence quality depended on proper precleaning of the substrate before deposition. N2 or air was introduced for correct stoichiometry in metallic compounds. Au, Ag, MgO, and Ta5Si3 films 8 microns thick have bond strength equal to 1 micron coatings; the bond strength of pure metallic films up to 5 microns thick was greater than the epoxy to film bond (8000 psi). The results of exposures of coated material to temperatures up to 700 C are presented.
Document ID
19810030594
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Mirtich, M. J.
(NASA Lewis Research Center Cleveland, Ohio, United States)
Date Acquired
August 11, 2013
Publication Date
October 1, 1980
Subject Category
Metallic Materials
Meeting Information
Meeting: National Symposium
Location: Detroit, MI
Start Date: October 14, 1980
End Date: October 17, 1980
Sponsors: American Vacuum Society
Accession Number
81A14998
Distribution Limits
Public
Copyright
Other

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