Maximum likelihood estimation of label imperfection probabilities and its use in the identification of mislabeled patterns

Estimating label imperfections and the use of estimations in the identification of mislabeled patterns are discussed. Expressions are presented for the asymptotic variances of the probability of correct classification and proportion, and for the maximum likelihood estimates of classification errors and a priori probabilities. Models are developed for imperfections in the labels and classification errors, and expressions are derived for the probability of imperfect label identification schemes resulting in wrong decisions. The expressions are used in computing thresholds and the techniques are given practical applications. The imperfect label identification scheme in the multiclass case is found to amount to establishing a region around each decision surface, and decisions of the label correction scheme are found in close agreement with the analyst-interpreter interpretations of the imagery films. As an example, the application of the maximum likelihood estimation to the processing of Landsat MSS data is discussed.