NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
High-temperature measurements of Q-factor in rotated X-cut quartz resonatorsThe Q-factors of piezoelectric resonators fabricated from natural and synthetic quartz with a 34 deg rotated X-cut orientation were measured at temperatures up to 325 C. The synthetic material, which was purified by electrolysis, retains a higher enough Q to be suitable for high temperature pressure-transducer applications, whereas the natural quartz is excessively lossy above 200 C for this application. The results are compared to results obtained previously at AT-cut resonators.
Document ID
19820007443
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Fritz, I. J.
(Sandia National Labs. Albuquerque, NM, United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA. Lewis Research Center Proc. of the Conf. on High-Temp. Electron.
Subject Category
Electronics And Electrical Engineering
Accession Number
82N15316
Funding Number(s)
CONTRACT_GRANT: DE-AC04-76DP-00789
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available