NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Review of literature surface tension data for molten siliconMeasurements of the surface tension of molten silicon are reported. For marangoni flow, the important parameter is the variation of surface tension with temperature, not the absolute value of the surface tension. It is not possible to calculate temperature coefficients using surface tension measurements from different experiments because the systematic errors are usually larger than the changes in surface tension because of temperature variations. The lack of good surface tension data for liquid silicon is probably due to its extreme chemical reactivity. A material which resists attack by molten silicon is not found. It is suggested that all of the sessile drip surface tension measurements are probably for silicon which is contaminated by the substrate materials.
Document ID
19820018471
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Hardy, S.
(National Bureau of Standards Washington, DC, United States)
Date Acquired
August 10, 2013
Publication Date
September 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Float Zone Workshop
Subject Category
Astronautics (General)
Accession Number
82N26347
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Document Inquiry

Available Downloads

There are no available downloads for this record.
No Preview Available